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DAC
2000
ACM
16 years 6 months ago
Test challenges for deep sub-micron technologies
The use of deep submicron process technologies presents several new challenges in the area of manufacturing test. While a significant body of work has been devoted to identifying ...
Kwang-Ting Cheng, Sujit Dey, Mike Rodgers, Kaushik...
140
Voted
DEBU
2008
156views more  DEBU 2008»
15 years 5 months ago
Towards Automatic Test Database Generation
Testing is one of the most expensive and time consuming activities in the software development cycle. In order to reduce the cost and the time to market, many approaches to automa...
Carsten Binnig, Donald Kossmann, Eric Lo
CEC
2007
IEEE
15 years 11 months ago
Estimation of distribution algorithms for testing object oriented software
— One of the main tasks software testing involves is the generation of the test cases to be used during the test. Due to its expensive cost, the automation of this task has becom...
Ramón Sagarna, Andrea Arcuri, Xin Yao
ICST
2009
IEEE
15 years 11 months ago
WS-TAXI: A WSDL-based Testing Tool for Web Services
Web Services (WSs) are the W3C-endorsed realization of the Service-Oriented Architecture (SOA). Since they are supposed to be implementation-neutral, WSs are typically tested blac...
Cesare Bartolini, Antonia Bertolino, Eda Marchetti...
IWANN
2009
Springer
15 years 11 months ago
Aiding Test Case Generation in Temporally Constrained State Based Systems Using Genetic Algorithms
Generating test data for formal state based specifications is computationally expensive. This paper improves a framework that addresses this issue by representing the test data ge...
Karnig Derderian, Mercedes G. Merayo, Robert M. Hi...