This paper presents a novel approach to interconnect fault location for FPGAs during power-on sequence. The method is based on a concept known as fault grading which utilizes defec...
Nicola Campregher, Peter Y. K. Cheung, Milan Vasil...
Abstract—As FPGA sizes and densities grow, their manufacturing yields decrease. This work looks toward reclaiming some of this lost yield. Several previous works have suggested f...
Noise and component failure is an increasingly difficult problem in modern electronic design. Bioinspired techniques is one approach that is applied in an effort to solve such is...
Morten Hartmann, Pauline C. Haddow, Per Kristian L...
Fault-tolerance is fundamental to the further development of mobile agent applications. In the context of mobile agents, fault-tolerance prevents a partial or complete loss of the...
A desired mesh architecture, based on connected-cycle modules, is constructed. To enhance the reliability, multiple bus sets and spare nodes are dynamically inserted to construct m...