1810 search results - page 70 / 362 » BASE: Using Abstraction to Improve Fault Tolerance |
101
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DAC
2006
ACM
16 years 25 days ago
2006
ACM
For a space compactor, degradation of fault detection capability caused by the masking effects from unknown values is much more serious than that caused by error masking (i.e. ali...
101
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VLSID
2001
IEEE
16 years 7 days ago
2001
IEEE
A technique for signature based diagnosis using windows of different sizes is presented. It allows to obtain increased diagnostic information from a given test at a lower cost, wi...
105
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TDSC
2010
14 years 10 months ago
2010
—Soft errors (or Transient faults) are temporary faults that arise in a circuit due to a variety of internal noise and external sources such as cosmic particle hits. Though soft ...
110
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HIPC
2004
Springer
15 years 5 months ago
2004
Springer
Abstract. Lock-free shared data structures in the setting of distributed computing have received a fair amount of attention. Major motivations of lock-free data structures include ...
120
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HPCA
2006
IEEE
16 years 7 days ago
2006
IEEE
As silicon technologies move into the nanometer regime, transistor reliability is expected to wane as devices become subject to extreme process variation, particle-induced transie...