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CVPR
2007
IEEE
16 years 1 months ago
Trace Ratio vs. Ratio Trace for Dimensionality Reduction
A large family of algorithms for dimensionality reduction end with solving a Trace Ratio problem in the form of arg maxW Tr(WT SpW)/Tr(WT SlW)1 , which is generally transformed in...
Huan Wang, Shuicheng Yan, Dong Xu, Xiaoou Tang, Th...
ICCV
2003
IEEE
16 years 1 months ago
Separating Reflection Components of Textured Surfaces using a Single Image
The presence of highlights, which in dielectric inhomogeneous objects are linear combination of specular and diffuse reflection components, is inevitable. A number of methods have...
Robby T. Tan, Katsushi Ikeuchi
ICCV
2003
IEEE
16 years 1 months ago
Ranking Prior Likelihood Distributions for Bayesian Shape Localization Framework
In this paper, we formulate the shape localization problem in the Bayesian framework. In the learning stage, we propose the Constrained RankBoost approach to model the likelihood ...
Shuicheng Yan, Mingjing Li, HongJiang Zhang, QianS...
ECCV
2002
Springer
16 years 1 months ago
What Can Be Known about the Radiometric Response from Images?
Abstract. Brightness values of pixels in an image are related to image irradiance by a non-linear function, called the radiometric response function. Recovery of this function is i...
Michael D. Grossberg, Shree K. Nayar
ECCV
2002
Springer
16 years 1 months ago
An Affine Invariant Interest Point Detector
This paper presents a novel approach for detecting affine invariant interest points. Our method can deal with significant affine transformations including large scale changes. Such...
Krystian Mikolajczyk, Cordelia Schmid