5604 search results - page 117 / 1121 » Becoming Increasingly Reliable |
172
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ERCIMDL
2007
Springer
15 years 10 months ago
2007
Springer
As information becomes available in increasing amounts, and to growing numbers of users, the shift towards a more user-centered, or personalized access to information becomes cruci...
191
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RTCSA
2008
IEEE
16 years 19 days ago
2008
IEEE
Reliability-aware power management (RAPM) schemes, which consider the negative effects of voltage scaling on system reliability, were recently studied to save energy while preserv...
192
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DAC
2006
ACM
16 years 6 days ago
2006
ACM
Negative bias temperature instability (NBTI) has become the dominant reliability concern for nanoscale PMOS transistors. In this paper, a predictive model is developed for the deg...
144
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GLVLSI
2010
IEEE
15 years 11 months ago
2010
IEEE
The development of compiler-based mechanisms to reduce the percentage of hotspots and optimize the thermal profile of large register files has become an important issue. Thermal...
175
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ICASSP
2008
IEEE
16 years 21 days ago
2008
IEEE
Missing data techniques have been recently applied to speaker recognition to increase performance in noisy environments. The drawback of these techniques is the vulnerability of t...