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MVA
2007
146views Computer Vision» more  MVA 2007»
14 years 11 months ago
A SVM Based Method to Detect Color Shift Defects in IC Packages
Automated Visual Inspection (AVI) is an essential part in the manufacturing process of Integrated Circuit (IC) packages. Contamination a common defect type found in IC packages ap...
R. M. C. B. Ratnayake, Craig Hicks, M. A. Akbari
IFIP12
2004
14 years 11 months ago
Model-Based Debugging with High-Level Observations
Recent years have seen considerable developments in modeling techniques for automatic fault location in programs. However, much of this research considered the models from a standa...
Wolfgang Mayer, Markus Stumptner
KDD
1998
ACM
164views Data Mining» more  KDD 1998»
15 years 1 months ago
A Data Mining Support Environment and its Application on Insurance Data
Huge masses of digital data about products, customers and competitors have become available for companies in the services sector. In order to exploit its inherent (and often hidde...
Martin Staudt, Jörg-Uwe Kietz, Ulrich Reimer
ESWS
2006
Springer
15 years 1 months ago
Matching Semantic Service Descriptions with Local Closed-World Reasoning
Abstract. Semantic Web Services were developed with the goal of automating the integration of business processes on the Web. The main idea is to express the functionality of the se...
Stephan Grimm, Boris Motik, Chris Preist
ICASSP
2007
IEEE
15 years 4 months ago
Fast Line-Based Imaging of Small Sample Features
This project aims to reduce the time required to attain more detailed scans of small interesting regions present in a quick first-pass sample image. In particular, we concentrate...
Mark A. Iwen, Gurjit S. Mandair, Michael D. Morris...