2324 search results - page 340 / 465 » Benchmark Generation Using Domain Specific Modeling |
ETS
2006
IEEE
15 years 4 months ago
2006
IEEE
BIST is an attractive approach to detect delay faults due to its inherent support for at-speed test. Deterministic logic BIST (DLBIST) is a technique which was successfully applie...
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ASPDAC
2004
ACM
15 years 3 months ago
2004
ACM
— The growing use of digital signal processors (DSPs) in embedded systems necessitates the use of optimizing compilers supporting their special architecture features. Beside the ...
ASPLOS
2008
ACM
15 years 3 days ago
2008
ACM
Multi-core processors, with low communication costs and high availability of execution cores, will increase the use of execution and compilation models that use short threads to e...
DATE
2008
IEEE
14 years 12 months ago
2008
IEEE
Advanced MOSFETs such as Strained Silicon (SS) devices have emerged as critical enablers to keep Moore's law on track for sub100nm technologies. Use of Strained Silicon devic...
ICST
2008
IEEE
15 years 4 months ago
2008
IEEE
–Abstract for conference - preliminary Model-Based Testing: Models for Test Cases Jan Tretmans, Embedded Systems Institute, Eindhoven : Systematic testing of software plays an im...