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DAC
2006
ACM
16 years 22 days ago
Standard cell characterization considering lithography induced variations
As VLSI technology scales toward 65nm and beyond, both timing and power performance of integrated circuits are increasingly affected by process variations. In practice, people oft...
Ke Cao, Sorin Dobre, Jiang Hu
SIGECOM
2005
ACM
169views ECommerce» more  SIGECOM 2005»
15 years 5 months ago
Online auctions with re-usable goods
This paper concerns the design of mechanisms for online scheduling in which agents bid for access to a re-usable resource such as processor time or wireless network access. Each a...
Mohammad Taghi Hajiaghayi, Robert D. Kleinberg, Mo...
ISAAC
2009
Springer
114views Algorithms» more  ISAAC 2009»
15 years 6 months ago
Good Programming in Transactional Memory
Abstract. In a multicore transactional memory (TM) system, concurrent execution threads interact and interfere with each other through shared memory. The less interference a progra...
Raphael Eidenbenz, Roger Wattenhofer
ICCAD
2009
IEEE
151views Hardware» more  ICCAD 2009»
14 years 9 months ago
Timing yield-aware color reassignment and detailed placement perturbation for double patterning lithography
Double patterning lithography (DPL) is a likely resolution enhancement technique for IC production in 32nm and below technology nodes. However, DPL gives rise to two independent, ...
Mohit Gupta, Kwangok Jeong, Andrew B. Kahng
ICCAD
1999
IEEE
181views Hardware» more  ICCAD 1999»
15 years 4 months ago
A new heuristic for rectilinear Steiner trees
The minimum rectilinear Steiner tree (RST) problem is one of the fundamental problems in the field of electronic design automation. The problem is NP-hard, and much work has been ...
Ion I. Mandoiu, Vijay V. Vazirani, Joseph L. Ganle...