Abstract. The performance of classification algorithms in machine learning is affected by the features used to describe the labeled examples presented to the inducers. Therefore,...
In this paper, we consider a problem that arises in black box testing: generating small test suites (i.e., sets of test cases) where the combinations that have to be covered are s...
Christine Cheng, Adrian Dumitrescu, Patrick J. Sch...
Naor and Yung show that a one-bit-compressing universal one-way hash function (UOWHF) can be constructed based on a one-way permutation. This construction can be iterated to build...
We present a Monte Carlo algorithm for testing multivariate polynomial identities over any field using fewer random bits than other methods. To test if a polynomial P(x1 ::: xn) ...
Optimizing a semiconductor wafer fab requires balancing technology and productivity. Recent work on productivity modeling will be described and focus on discrete event simulation ...