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ASPDAC
2007
ACM
144views Hardware» more  ASPDAC 2007»
15 years 1 months ago
Parameter Reduction for Variability Analysis by Slice Inverse Regression (SIR) Method
With semiconductor fabrication technologies scaled below 100 nm, the design-manufacturing interface becomes more and more complicated. The resultant process variability causes a nu...
Alexander V. Mitev, Michael Marefat, Dongsheng Ma,...
AAAI
2007
15 years 2 days ago
A Method for Large-Scale l1-Regularized Logistic Regression
Kwangmoo Koh, Seung-Jean Kim, Stephen P. Boyd