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» Bounded-lifetime integrated circuits
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103
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ASPDAC
2007
ACM
101views Hardware» more  ASPDAC 2007»
15 years 4 months ago
Core-Based Testing of Multiprocessor System-on-Chips Utilizing Hierarchical Functional Buses
Abstract--An integrated test scheduling methodology for multiprocessor System-on-Chips (SOC) utilizing the functional buses for test data delivery is described. The proposed method...
Fawnizu Azmadi Hussin, Tomokazu Yoneda, Alex Orail...
104
Voted
DATE
2004
IEEE
131views Hardware» more  DATE 2004»
15 years 4 months ago
Efficient Modular Testing of SOCs Using Dual-Speed TAM Architectures
The increasing complexity of system-on-chip (SOC) integrated circuits has spurred the development of versatile automatic test equipment (ATE) that can simultaneously drive differe...
Anuja Sehgal, Krishnendu Chakrabarty
114
Voted
EURODAC
1995
IEEE
127views VHDL» more  EURODAC 1995»
15 years 4 months ago
Layout synthesis for datapath designs
DPLAYOUT is a layout synthesis tool for bit-sliced datapath designs targeting standard-cell libraries. We developed fast and efficient heuristics for placing the cells in a bit-s...
Naveen Buddi, Malgorzata Chrzanowska-Jeske, Charle...
81
Voted
FPL
1995
Springer
106views Hardware» more  FPL 1995»
15 years 4 months ago
Some Notes on Power Management on FPGA-Based Systems
Although the energy required to perform a logic operation has continuously dropped at least by ten orders of magnitude since early vacuumtube electronics [1], the increasing clock ...
Eduardo I. Boemo, Guillermo González de Riv...
115
Voted
DAC
2010
ACM
15 years 4 months ago
Post-silicon validation opportunities, challenges and recent advances
Post-silicon validation is used to detect and fix bugs in integrated circuits and systems after manufacture. Due to sheer design complexity, it is nearly impossible to detect and ...
Subhasish Mitra, Sanjit A. Seshia, Nicola Nicolici