1343 search results - page 109 / 269 » Bounded-lifetime integrated circuits |
94
Voted
DAC
2010
ACM
15 years 2 months ago
2010
ACM
In this study, we propose the use of specialized influence models to capture the dynamic behavior of a Network-onChip (NoC). Our goal is to construct a versatile modeling framewor...
79
Voted
MVA
2007
15 years 2 months ago
2007
Automated Visual Inspection (AVI) is an essential part in the manufacturing process of Integrated Circuit (IC) packages. Contamination a common defect type found in IC packages ap...
125
Voted
RECOSOC
2007
15 years 2 months ago
2007
Nowadays, reconfigurable and multiprocessor systems are becoming increasingly attractive for many applications. Such systems should be more and more dependable especially if error...
90
Voted
CDES
2006
15 years 2 months ago
2006
The ability to improve the yield of integrated circuits through layout modification has been recognized and several techniques for yield enhanced routing and compaction have been ...
107
click to vote
CSREAESA
2004
15 years 2 months ago
2004
Interconnect delays are increasingly becoming the dominant source of performance degradation in the nano-meter regime, largely because the wires do not scale as fast as the device...