1343 search results - page 113 / 269 » Bounded-lifetime integrated circuits |
106
click to vote
ICCAD
2009
IEEE
14 years 10 months ago
2009
IEEE
We propose a layout-driven test-architecture design and optimization technique for core-based system-on-chips (SoCs) that are fabricated using three-dimensional (3D) integration. ...
ICCAD
2009
IEEE
14 years 10 months ago
2009
IEEE
As the complexity of integrated circuits has increased, so has the need for improving testing efficiency. Unfortunately, the types of defects are also becoming more complex, which...
109
Voted
TE
2010
14 years 7 months ago
2010
The semiconductor industry is lacking qualified integrated circuit (IC) test engineers to serve in the field of mixed-signal electronics. The absence of mixed-signal IC test educat...
123
Voted
FPL
2011
Springer
14 years 21 days ago
2011
Springer
Abstract—Soft on-FGPA interconnection networks are gaining increasing importance since they simplify the integration of heterogeneous components and offer, at the same time, a mo...
304
Voted
DAC
2012
ACM
13 years 3 months ago
2012
ACM
A scalable architecture to design high radix switch fabric is presented. It uses circuit techniques to re-use existing input and output data buses and switching logic for fabric c...