1343 search results - page 208 / 269 » Bounded-lifetime integrated circuits |
121
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TCAD
2011
14 years 6 months ago
2011
—Pre-bond testing of 3-D stacked integrated circuits (ICs) involves testing each individual die before bonding. The overall yield of 3-D ICs improves with pre-bond testability be...
103
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TVLSI
2010
14 years 6 months ago
2010
By storing more than one bit in each memory cell, multi-level per cell (MLC) NAND flash memories are dominating global flash memory market due to their appealing storage density ad...
141
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WH
2010
14 years 6 months ago
2010
Ubiquitous physiological monitoring will be a key driving force in the upcoming wireless health revolution. Cardiac and brain signals in the form of ECG and EEG are two critical h...
185
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ISCA
2011
IEEE
14 years 3 months ago
2011
IEEE
Emerging memory technologies such as STT-RAM, PCRAM, and resistive RAM are being explored as potential replacements to existing on-chip caches or main memories for future multi-co...
IEPOL
2011
14 years 3 months ago
2011
In this paper, we construct a price index for broadband services in the United States between 2004 and 2009. We analyze over 1500 service contracts offered by DSL and cable provid...