1343 search results - page 210 / 269 » Bounded-lifetime integrated circuits |
DAC
2008
ACM
16 years 25 days ago
2008
ACM
In modular testing of system-on-a-chip (SoC), test access mechanisms (TAMs) are used to transport test data between the input/output pins of the SoC and the cores under test. Prio...
100
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DAC
2008
ACM
16 years 25 days ago
2008
ACM
As integrated circuit technology plumbs ever greater depths in the scaling of feature sizes, maintaining the paradigm of deterministic Boolean computation is increasingly challeng...
DAC
2004
ACM
16 years 24 days ago
2004
ACM
timing analysis tools to replace standard deterministic static timing analyzers whereas [8,27] develop approaches for the statistical estimation of leakage power considering within...
102
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DAC
2004
ACM
16 years 24 days ago
2004
ACM
It has been widely recognized that the dynamic range information of an application can be exploited to reduce the datapath bitwidth of either processors or ASICs, and therefore th...
DAC
2005
ACM
16 years 24 days ago
2005
ACM
Device optimization considering supply voltage Vdd and threshold voltage Vt tuning does not increase chip area but has a great impact on power and performance in the nanometer tec...