1343 search results - page 211 / 269 » Bounded-lifetime integrated circuits |
ICCAD
2006
IEEE
15 years 8 months ago
2006
IEEE
Parametric yield loss due to variability can be effectively reduced by both design-time optimization strategies and by adjusting circuit parameters to the realizations of variable...
ICCAD
2006
IEEE
15 years 8 months ago
2006
IEEE
High power consumption will shorten battery life for handheld devices and cause thermal and reliability problems. One way to lower the dynamic power consumption is to reduce the s...
ISPD
2010
ACM
15 years 6 months ago
2010
ACM
In the nanometer IC design, dummy fill is often performed to improve layout pattern uniformity and the post-CMP quality. However, filling dummies might greatly increase intercon...
ICCAD
2008
IEEE
15 years 6 months ago
2008
IEEE
— Dynamic power noises may not only degrade the circuit performance but also reduce the noise margin which may result in the functional errors in integrated circuit. Decoupling c...
GLVLSI
2006
IEEE
15 years 5 months ago
2006
IEEE
Process variations have become a key concern of circuit designers because of their significant, yet hard to predict impact on performance and signal integrity of VLSI circuits. St...