1343 search results - page 221 / 269 » Bounded-lifetime integrated circuits |
104
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DAC
2009
ACM
16 years 25 days ago
2009
ACM
Embedded cryptosystems show increased vulnerabilities to implementation attacks such as power analysis. CMOS technology trends are causing increased process variations which impac...
DAC
2008
ACM
16 years 25 days ago
2008
ACM
In this paper, we present ELIAD, an efficient lithography aware detailed router to optimize silicon image after optical proximity correction (OPC) in a correct-by-construction man...
DAC
2007
ACM
16 years 25 days ago
2007
ACM
Due to shrinking technology, increasing functional frequency and density, and reduced noise margins with supply voltage scaling, the sensitivity of designs to supply voltage noise...
DAC
2002
ACM
16 years 24 days ago
2002
ACM
At-speed testing of high-speed circuits is becoming increasingly difficult with external testers due to the growing gap between design and tester performance, growing cost of high...
104
click to vote
DAC
2002
ACM
16 years 24 days ago
2002
ACM
For present-day micro-electronic designs, it is becoming ever more important to accurately model substrate coupling effects. Basically, either a Finite Element Method (FEM) or a B...