1343 search results - page 58 / 269 » Bounded-lifetime integrated circuits |
ICCD
2004
IEEE
15 years 6 months ago
2004
IEEE
Abstract - This paper describes a communicationcentric design methodology that addresses the fundamental challenges induced by the emergence of truly heterogeneous Systems-on-Chip ...
DAC
2009
ACM
15 years 10 months ago
2009
ACM
Circuit reliability is affected by various fabrication-time and run-time effects. Fabrication-induced process variation has significant impact on circuit performance and reliabilit...
ASPDAC
2008
ACM
14 years 11 months ago
2008
ACM
ACT Benchmarks are an immensely useful tool in performing research since they allow for rapid and clear comparison between different approaches to solving CAD problems. Recent expe...
JETC
2008
14 years 8 months ago
2008
With aggressive reductions in feature sizes and the integration of multiple functionalities on the same die, bottlenecks due to I/O pin limitations have become a severe issue in to...
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ISPD
2011
ACM
14 years 21 days ago
2011
ACM
Three-dimensional ICs promise to significantly extend the scale of system integration and facilitate new-generation electronics. However, progress in commercial 3D ICs has been s...