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INTEGRATION
2006
14 years 9 months ago
2006
Improving testability during the early stages of high-level synthesis has several benefits including reduced test hardware overheads, reduced test costs, reduced design iterations...
DATE
2002
IEEE
15 years 2 months ago
2002
IEEE
In this paper, a method for nominal design of analog integrated circuits is presented that includes process variations and operating ranges by worst-case parameter sets. These set...
VTS
2000
IEEE
15 years 2 months ago
2000
IEEE
Testing of high performance integrated circuits is becoming increasingly a challenging task owing to high clock frequencies. Often testers are not able to test such devices due to...
DAC
2007
ACM
15 years 10 months ago
2007
ACM
Thermal problems and limitations on interlayer via densities are important design constraints on three-dimensional integrated circuits (3D ICs), and need to be considered during g...
DAC
1999
ACM
15 years 2 months ago
1999
ACM
In this survey paper we describethe combination of: discretized integral formulations, sparsication techniques, and krylov-subspace based model-order reduction that has led to rob...