1343 search results - page 67 / 269 » Bounded-lifetime integrated circuits |
DATE
2008
IEEE
15 years 4 months ago
2008
IEEE
This paper presents the design and the laboratory results of an integrated half-bridge driver for power electronic systems in a 0.35 µm Bipolar CMOS DMOS (BCD) technology. The pr...
ICCD
2004
IEEE
15 years 6 months ago
2004
IEEE
Research in high-speed interconnect requires physical test to validate circuit models and design assumptions. At multi-Gbit/sec rates, physical implementations require custom circ...
JSA
2007
14 years 9 months ago
2007
This paper presents a multi-language framework to FPGA hardware development which aims to satisfy the dual requirement of high level hardware design and efficient hardware impleme...
ICCAD
2008
IEEE
15 years 4 months ago
2008
IEEE
This paper presents ISCLEs, a novel and robust analog design method that promises to scale with Moore’s Law, by doing boosting-style importance sampling on digital-sized circuit...
ISQED
2006
IEEE
15 years 3 months ago
2006
IEEE
Due to aggressive technology scaling, VLSI circuits are becoming increasingly susceptible to transient errors caused by single-event-upsets (SEUs). In this paper, we introduce two...