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ASAP
1997
IEEE
15 years 2 months ago
1997
IEEE
Improvements in semiconductor integration density and the resulting problem of having to manage designs of increasing complexity is an old one, but still current. The new challeng...
TVLSI
2002
14 years 9 months ago
2002
Although simulation remains an important part of application-specific integrated circuit (ASIC) validation, hardware-assisted parallel verification is becoming a larger part of the...
ICCAD
2010
IEEE
14 years 7 months ago
2010
IEEE
In this paper, we propose a new technique, referred to as MultiWafer Virtual Probe (MVP) to efficiently model wafer-level spatial variations for nanoscale integrated circuits. Tow...
VLSI
2010
Springer
14 years 4 months ago
2010
Springer
Electro-Magnetic Analysis has been identified as an efficient technique to retrieve the secret key of cryptographic algorithms. Although similar mathematically speaking, Power or E...
DAC
2011
ACM
13 years 9 months ago
2011
ACM
In the era of deep sub-wavelength lithography for nanometer VLSI designs, manufacturability and yield issues are critical and need to be addressed during the key physical design i...