As timing requirements in today’s advanced VLSI designs become more aggressive, the need for automated tools to diagnose timing failures increases. This work presents two such a...
Jiang Brandon Liu, Magdy S. Abadir, Andreas G. Ven...
Successful failure analysis requires accurate fault diagnosis. This paper presents a method for diagnosing bridging faults that improves on previous methods. The new method uses s...
David B. Lavo, Brian Chess, Tracy Larrabee, F. Joe...
A deductive technique is presented that uses voltage testing for the diagnosis of single bridging faults between two gate input or output lines and is applicable to combinational ...
A gate level, automated fault diagnosis scheme is proposed for scan-based BIST designs. The proposed scheme utilizes both fault capturing scan chain information and failing test v...