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ITC
1997
IEEE
90views Hardware» more  ITC 1997»
13 years 10 months ago
Bridging Fault Diagnosis in the Absence of Physical Information
David B. Lavo, Tracy Larrabee, F. Joel Ferguson, B...
GLVLSI
2005
IEEE
83views VLSI» more  GLVLSI 2005»
13 years 12 months ago
Diagnosing multiple transition faults in the absence of timing information
As timing requirements in today’s advanced VLSI designs become more aggressive, the need for automated tools to diagnose timing failures increases. This work presents two such a...
Jiang Brandon Liu, Magdy S. Abadir, Andreas G. Ven...
TCAD
1998
109views more  TCAD 1998»
13 years 5 months ago
Diagnosing realistic bridging faults with single stuck-at information
Successful failure analysis requires accurate fault diagnosis. This paper presents a method for diagnosing bridging faults that improves on previous methods. The new method uses s...
David B. Lavo, Brian Chess, Tracy Larrabee, F. Joe...
ICCAD
1997
IEEE
125views Hardware» more  ICCAD 1997»
13 years 10 months ago
A deductive technique for diagnosis of bridging faults
A deductive technique is presented that uses voltage testing for the diagnosis of single bridging faults between two gate input or output lines and is applicable to combinational ...
Srikanth Venkataraman, W. Kent Fuchs
DATE
2002
IEEE
99views Hardware» more  DATE 2002»
13 years 11 months ago
Gate Level Fault Diagnosis in Scan-Based BIST
A gate level, automated fault diagnosis scheme is proposed for scan-based BIST designs. The proposed scheme utilizes both fault capturing scan chain information and failing test v...
Ismet Bayraktaroglu, Alex Orailoglu