74 search results - page 13 / 15 » Built-in test generation for synchronous sequential circuits |
JAIR
2010
14 years 8 months ago
2010
Model-based diagnostic reasoning often leads to a large number of diagnostic hypotheses. The set of diagnoses can be reduced by taking into account extra observations (passive mon...
ICCD
2006
IEEE
15 years 6 months ago
2006
IEEE
Circuit activity is a function of input patterns. When circuit activity changes abruptly, it can cause sudden drop or rise in power supply voltage. This change is known as power d...
ATS
2005
IEEE
15 years 3 months ago
2005
IEEE
In this paper, we propose an oscillation-based test methodology for sequential testing. This approach provides many advantages over traditional methods. (1) It is at-speed testing...
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INTEGRATION
2006
14 years 9 months ago
2006
Improving testability during the early stages of high-level synthesis has several benefits including reduced test hardware overheads, reduced test costs, reduced design iterations...
ICCAD
1999
IEEE
15 years 1 months ago
1999
IEEE
We describe a method referred to as sequence counting to improve on the levels of compaction achievable by vector omission based static compaction procedures. Such procedures are ...