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APCCAS
2006
IEEE
307views Hardware» more  APCCAS 2006»
15 years 10 months ago
A Fast-Lock-In ADPLL with High-Resolution and Low-Power DCO for SoC Applications
Duo Sheng, Ching-Che Chung, Chen-Yi Lee
DATE
2006
IEEE
134views Hardware» more  DATE 2006»
15 years 10 months ago
Power constrained and defect-probability driven SoC test scheduling with test set partitioning
1 This paper presents a test scheduling approach for system-onchip production tests with peak-power constraints. An abort-onfirst-fail test approach is assumed, whereby the test is...
Zhiyuan He, Zebo Peng, Petru Eles
DATE
2006
IEEE
116views Hardware» more  DATE 2006»
15 years 10 months ago
SoC: fuelling the hopes of the mobile industry
Uwe Lambrette, Booz Allen Hamilton