307 search results - page 42 / 62 » Calculating Architectural Reliability via Modeling and Analy... |
82
Voted
DAC
2006
ACM
15 years 10 months ago
2006
ACM
Chips manufactured in 90 nm technology have shown large parametric variations, and a worsening trend is predicted. These parametric variations make circuit optimization difficult ...
ASPLOS
2010
ACM
15 years 4 months ago
2010
ACM
Temperature is a dominant factor in the performance, reliability, and leakage power consumption of modern processors. As a result, increasing numbers of researchers evaluate therm...
77
Voted
ICDCSW
2005
IEEE
15 years 3 months ago
2005
IEEE
Capacity estimation is an important part of covert channel analysis. It measures the severity of a covert channel by estimating the maximum information rate attainable over it. Tr...
DAC
2010
ACM
15 years 1 months ago
2010
ACM
As the geometry shrinking faces severe limitations, 3D wafer stacking with through silicon via (TSV) has gained interest for future SOC integration. Since TSV fill material and s...
MASCOTS
2008
14 years 11 months ago
2008
Commercial servers, such as database or application servers, often attempt to improve performance via multithreading. Improper multi-threading architectures can incur contention, ...