6167 search results - page 931 / 1234 » Can Refinement be Automated |
125
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DAC
2003
ACM
16 years 5 months ago
2003
ACM
Recent advances in tester technology have led to automatic test equipment (ATE) that can operate at up to several hundred MHz. However, system-on-chip (SOC) scan chains typically ...
122
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DAC
2003
ACM
16 years 5 months ago
2003
ACM
SAT-based decision procedures for quantifier-free fragments of firstorder logic have proved to be useful in formal verification. These decision procedures are either based on enco...
123
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DAC
2004
ACM
16 years 5 months ago
2004
ACM
The need for low-power, small factor secondary storage device has led to the widespread use of flash memory in embedded systems. The energy consumption of processor and flash base...
138
Voted
DAC
2004
ACM
16 years 5 months ago
2004
ACM
As process technology migrates to deep submicron with feature size less than 100nm, global wire delay is becoming a major hindrance in keeping the latency of intra-chip communicat...
116
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DAC
2004
ACM
16 years 5 months ago
2004
ACM
Recent successes in the development and self-assembly of nanoelectronic devices suggest that the ability to manufacture dense nanofabrics is on the near horizon. However, the trem...