6167 search results - page 934 / 1234 » Can Refinement be Automated |
117
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DAC
2005
ACM
16 years 5 months ago
2005
ACM
Physical phenomena such as temperature have an increasingly important role in performance and reliability of modern process technologies. This trend will only strengthen with futu...
110
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DAC
2005
ACM
16 years 5 months ago
2005
ACM
Partitioned BDD-based algorithms have been proposed in the literature to solve the memory explosion problem in BDD-based verification. Such algorithms can be at times ineffective ...
134
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DAC
2005
ACM
16 years 5 months ago
2005
ACM
Device and interconnect fabrics at the nanoscale will have a density of defects and susceptibility to transient faults far exceeding those of current silicon technologies. In this...
126
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DAC
2006
ACM
16 years 5 months ago
2006
ACM
Modern integrated circuits require careful attention to the soft-error rate (SER) resulting from bit upsets, which are normally caused by alpha particle or neutron hits. These eve...
132
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DAC
2006
ACM
16 years 5 months ago
2006
ACM
In this paper, we propose an adaptive low-power bus encoding algorithm based on weighted code mapping (WCM) and the delayed bus technique. The WCM algorithm transforms an original...