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VTS
2008
IEEE
83views Hardware» more  VTS 2008»
16 years 1 months ago
LS-TDF: Low-Switching Transition Delay Fault Pattern Generation
— Higher chip densities and the push for higher performance have continued to drive design needs. Transition delay fault testing has become the preferred method for ensuring thes...
Jeremy Lee, Mohammad Tehranipoor
AGILEDC
2007
IEEE
16 years 1 months ago
On the Sustained Use of a Test-Driven Development Practice at IBM
Test-Driven Development (TDD) is an agile practice that is widely accepted and advocated by most agile methods and methodologists. In this paper, we report on a post hoc analysis ...
Julio Cesar Sanchez, Laurie A. Williams, E. Michae...
MMM
2007
Springer
198views Multimedia» more  MMM 2007»
16 years 1 months ago
A Shape Distribution for Comparing 3D Models
This study developed a new shape-based 3D model descriptor based on the D2 shape descriptor developed by Osada, et al of Princeton University. Shape descriptors can be used to meas...
Levi C. Monteverde, Conrado R. Ruiz Jr., Zhiyong H...
CP
2007
Springer
16 years 1 months ago
The Log-Support Encoding of CSP into SAT
It is known that Constraint Satisfaction Problems (CSP) can be converted into Boolean Satisfiability problems (SAT); however how to encode a CSP into a SAT problem such that a SAT...
Marco Gavanelli
CPAIOR
2007
Springer
16 years 1 months ago
A Position-Based Propagator for the Open-Shop Problem
The Open-Shop Problem is a hard problem that can be solved using Constraint Programming or Operation Research methods. Existing techniques are efficient at reducing the search tree...
Jean-Noël Monette, Yves Deville, Pierre Dupon...
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