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84
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ITC
2003
IEEE
108views Hardware» more  ITC 2003»
15 years 8 months ago
Backplane Test Bus Applications For IEEE STD 1149.1
Prior to the mid 1980s, the dominance of through-hole packaging of integrated circuits (ICs) provided easy access to nearly every pin of every chip on a printed circuit board. Pro...
Clayton Gibbs
SPIRE
2001
Springer
15 years 7 months ago
Speeding-up Hirschberg and Hunt-Szymanski LCS Algorithms
Two algorithms are presented that solve the problem of recovering the longest common subsequence of two strings. The £rst algorithm is an improvement of Hirschberg’s divide-andc...
Maxime Crochemore, Costas S. Iliopoulos, Yoan J. P...
ATS
1998
IEEE
106views Hardware» more  ATS 1998»
15 years 7 months ago
A Test Pattern Generation Algorithm Exploiting Behavioral Information
This paper aims at broadening the scope of hierarchical ATPG to the behavioral-level The main problem of using behavioral information for ATPG is the mismatch of timing models bet...
Silvia Chiusano, Fulvio Corno, Paolo Prinetto
83
Voted
ICCAD
1994
IEEE
76views Hardware» more  ICCAD 1994»
15 years 7 months ago
Simultaneous functional-unit binding and floorplanning
As device feature size decreases, interconnection delay becomes the dominating factor of system performance. Thus it is important that accurate physical information is used during...
Yung-Ming Fang, D. F. Wong
NIPS
2008
15 years 4 months ago
Relative Margin Machines
In classification problems, Support Vector Machines maximize the margin of separation between two classes. While the paradigm has been successful, the solution obtained by SVMs is...
Pannagadatta K. Shivaswamy, Tony Jebara