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CVPR
2009
IEEE
16 years 4 months ago
Learning a Distance Metric from Multi-instance Multi-label Data
Multi-instance multi-label learning (MIML) refers to the learning problems where each example is represented by a bag/collection of instances and is labeled by multiple labels. ...
Rong Jin (Michigan State University), Shijun Wang...
ICCV
2003
IEEE
15 years 11 months ago
A Class of Photometric Invariants: Separating Material from Shape and Illumination
We derive a new class of photometric invariants that can be used for a variety of vision tasks including lighting invariant material segmentation, change detection and tracking, a...
Srinivasa G. Narasimhan, Visvanathan Ramesh, Shree...
ECCV
2008
Springer
15 years 11 months ago
SIFT Flow: Dense Correspondence across Different Scenes
While image registration has been studied in different areas of computer vision, aligning images depicting different scenes remains a challenging problem, closer to recognition tha...
Ce Liu, Jenny Yuen, Antonio B. Torralba, Josef Siv...
ICIP
2005
IEEE
15 years 11 months ago
A dynamic Bezier curve model
Bezier curves (BC) are fundamental to a wide range of applications from computer-aided design through to object shape descriptions and surface mapping. Since BC only consider glob...
Ferdous Ahmed Sohel, Laurence S. Dooley, Gour C. K...
ICPR
2000
IEEE
15 years 10 months ago
Nanometer-Scale Height Measurements in Micromachined Picoliter Vials Based on Interference Fringe Analysis
Micromachined picoliter vials in silicon dioxide with a typical depth of 6.0?m are filled with a liquid sample. Epiilluminated microscopic imaging during evaporation of the liquid...
L. R. Van den Doel, Lucas J. van Vliet, K. T. Hjel...