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ICCAD
2006
IEEE
119views Hardware» more  ICCAD 2006»
15 years 8 months ago
Post-placement voltage island generation
High power consumption will shorten battery life for handheld devices and cause thermal and reliability problems. One way to lower the dynamic power consumption is to reduce the s...
Royce L. S. Ching, Evangeline F. Y. Young, Kevin C...
ISPD
2010
ACM
195views Hardware» more  ISPD 2010»
15 years 6 months ago
Density gradient minimization with coupling-constrained dummy fill for CMP control
In the nanometer IC design, dummy fill is often performed to improve layout pattern uniformity and the post-CMP quality. However, filling dummies might greatly increase intercon...
Huang-Yu Chen, Szu-Jui Chou, Yao-Wen Chang
DAC
2007
ACM
16 years 27 days ago
Towards An Ultra-Low-Power Architecture Using Single-Electron Tunneling Transistors
Minimizing power consumption is vitally important in embedded system design; power consumption determines battery lifespan. Ultralow-power designs may even permit embedded systems...
Changyun Zhu, Zhenyu (Peter) Gu, Li Shang, Robert ...
DAC
2012
ACM
13 years 2 months ago
Is dark silicon useful?: harnessing the four horsemen of the coming dark silicon apocalypse
Due to the breakdown of Dennardian scaling, the percentage of a silicon chip that can switch at full frequency is dropping exponentially with each process generation. This utiliza...
Michael B. Taylor
ICCAD
2009
IEEE
136views Hardware» more  ICCAD 2009»
14 years 9 months ago
Multi-functional interconnect co-optimization for fast and reliable 3D stacked ICs
Heat removal and power delivery have become two major reliability concerns in 3D stacked IC technology. For thermal problem, two possible solutions exist: thermal-through-silicon-...
Young-Joon Lee, Rohan Goel, Sung Kyu Lim