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218
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ISPD
2012
ACM
13 years 7 months ago
2012
ACM
As technology scales and frequency increases, a new design style is emerging, referred to as hybrid designs, which contain a mixture of random logic and datapath standard cell com...
GLVLSI
2005
IEEE
15 years 5 months ago
2005
IEEE
We present simulations for ultra-thin body, fully-depleted, double-gate (DG) silicon-on-insulator (SOI) devices that can be readily optimized for both static power loss and perfor...
DAC
2006
ACM
15 years 5 months ago
2006
ACM
This panel discusses the following topics. With the ongoing trend towards more and more digitization in applications ranging from multimedia to telecommunications, there is a big ...
DAC
2009
ACM
16 years 23 days ago
2009
ACM
Circuit reliability is affected by various fabrication-time and run-time effects. Fabrication-induced process variation has significant impact on circuit performance and reliabilit...
102
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DAC
2004
ACM
16 years 22 days ago
2004
ACM
Long design cycles due to the inability to predict silicon realities is a well-known problem that plagues analog/RF integrated circuit product development. As this problem worsens...