852 search results - page 46 / 171 » Categories, Allegories and Circuit Design |
DAC
2004
ACM
16 years 24 days ago
2004
ACM
The negative effect of electromigration on signal and power line lifetime and functional reliability is an increasingly important problem for the physical design of integrated cir...
DAC
2005
ACM
16 years 24 days ago
2005
ACM
This paper presents a unifying framework for the modeling of asynchronous pipeline circuits. A pipeline protocol is captured in a graph-based model which defines the partial order...
SBCCI
2005
ACM
15 years 5 months ago
2005
ACM
In this paper it will be demonstrated, from the theory and measurements, that series-parallel (SP) mirrors allow building current copiers with copy factors of thousands, without d...
113
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DAC
2006
ACM
15 years 5 months ago
2006
ACM
Negative bias temperature instability (NBTI) has become the dominant reliability concern for nanoscale PMOS transistors. In this paper, a predictive model is developed for the deg...
118
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TODAES
2008
14 years 11 months ago
2008
The extremely high cost of custom ASIC fabrication makes FPGAs an attractive alternative for deployment of custom hardware. Embedded systems based on reconfigurable hardware integ...