Sciweavers

852 search results - page 48 / 171
» Categories, Allegories and Circuit Design
Sort
View
DAC
2007
ACM
16 years 25 days ago
Characterization and Estimation of Circuit Reliability Degradation under NBTI using On-Line IDDQ Measurement
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
Kunhyuk Kang, Kee-Jong Kim, Ahmad E. Islam, Muhamm...
ISPD
2012
ACM
248views Hardware» more  ISPD 2012»
13 years 7 months ago
A fast estimation of SRAM failure rate using probability collectives
Importance sampling is a popular approach to estimate rare event failures of SRAM cells. We propose to improve importance sampling by probability collectives. First, we use “Kul...
Fang Gong, Sina Basir-Kazeruni, Lara Dolecek, Lei ...
DAC
2006
ACM
16 years 24 days ago
An efficient retiming algorithm under setup and hold constraints
In this paper we present a new efficient algorithm for retiming sequential circuits with edge-triggered registers under both setup and hold constraints. Compared with the previous...
Chuan Lin, Hai Zhou
GLVLSI
2008
IEEE
117views VLSI» more  GLVLSI 2008»
15 years 6 months ago
Delay driven AIG restructuring using slack budget management
Timing optimizations during logic synthesis has become a necessary step to achieve timing closure in VLSI designs. This often involves “shortening” all paths found in the circ...
Andrew C. Ling, Jianwen Zhu, Stephen Dean Brown
GLVLSI
2007
IEEE
111views VLSI» more  GLVLSI 2007»
15 years 6 months ago
Probabilistic gate-level power estimation using a novel waveform set method
A probabilistic power estimation technique for combinational circuits is presented. A novel set of simple waveforms is the kernel of this technique. The transition density of each...
Saeeid Tahmasbi Oskuii, Per Gunnar Kjeldsberg, Ein...