Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
Kunhyuk Kang, Kee-Jong Kim, Ahmad E. Islam, Muhamm...
Importance sampling is a popular approach to estimate rare event failures of SRAM cells. We propose to improve importance sampling by probability collectives. First, we use “Kul...
Fang Gong, Sina Basir-Kazeruni, Lara Dolecek, Lei ...
In this paper we present a new efficient algorithm for retiming sequential circuits with edge-triggered registers under both setup and hold constraints. Compared with the previous...
Timing optimizations during logic synthesis has become a necessary step to achieve timing closure in VLSI designs. This often involves “shortening” all paths found in the circ...
A probabilistic power estimation technique for combinational circuits is presented. A novel set of simple waveforms is the kernel of this technique. The transition density of each...
Saeeid Tahmasbi Oskuii, Per Gunnar Kjeldsberg, Ein...