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» Causality based generation of directed test cases
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ITC
1997
IEEE
129views Hardware» more  ITC 1997»
15 years 2 months ago
On Using Machine Learning for Logic BIST
This paper presents a new approach for designing test sequences to be generated on–chip. The proposed technique is based on machine learning, and provides a way to generate effi...
Christophe Fagot, Patrick Girard, Christian Landra...
FATES
2004
Springer
15 years 3 months ago
Online Testing of Real-time Systems Using Uppaal
We present the development of T-UPPAAL — a new tool for online black-box testing of real-time embedded systems from non-deterministic timed automata specifications. It is based ...
Kim Guldstrand Larsen, Marius Mikucionis, Brian Ni...
SRDS
2008
IEEE
15 years 4 months ago
Systematic Structural Testing of Firewall Policies
Firewalls are the mainstay of enterprise security and the most widely adopted technology for protecting private networks. As the quality of protection provided by a firewall dire...
JeeHyun Hwang, Tao Xie, Fei Chen, Alex X. Liu
DSRT
2008
IEEE
14 years 11 months ago
Two Complementary Tools for the Formal Testing of Distributed Systems with Time Constraints
The complexity and the variety of the deployed timedependent systems, as well as the high degree of reliability required for their global functioning, justify the care provided to...
Ana R. Cavalli, Edgardo Montes de Oca, Wissam Mall...
ASWEC
2007
IEEE
15 years 2 months ago
Managing Conflicts When Using Combination Strategies to Test Software
Testers often represent systems under test in input parameter models. These contain parameters with associated values. Combinations of parameter values, with one value for each pa...
Mats Grindal, Jeff Offutt, Jonas Mellin