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» Causality based generation of directed test cases
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VLSID
2010
IEEE
155views VLSI» more  VLSID 2010»
14 years 7 months ago
Synchronized Generation of Directed Tests Using Satisfiability Solving
Directed test generation is important for the functional verification of complex system-on-chip designs. SAT based bounded model checking is promising for counterexample generatio...
Xiaoke Qin, Mingsong Chen, Prabhat Mishra
ICSE
2009
IEEE-ACM
14 years 7 months ago
Model Based Functional Testing Using Pattern Directed Filmstrips
Model driven functional system testing generates test scenarios from behavioural and structural models. In order to autmatically generate tests, conditions such as invariants and ...
Tony Clark
ICSEA
2007
IEEE
15 years 4 months ago
Test-Case Generation and Coverage Analysis for Nondeterministic Systems Using Model-Checkers
Abstract—Nondeterminism is used as a means of underspecification or implementation choice in specifications, and it is often necessary if part of a system or the environment is...
Gordon Fraser, Franz Wotawa
IFIP
2001
Springer
15 years 2 months ago
Functional Test Generation using Constraint Logic Programming
— Semi-formal verification based on symbolic simulation offers a good compromise between formal model checking and numerical simulation. The generation of functional test vector...
Zhihong Zeng, Maciej J. Ciesielski, Bruno Rouzeyre
COMPSAC
2003
IEEE
15 years 3 months ago
BINTEST - Binary Search-based Test Case Generation
One of the important tasks during software testing is the generation of test cases. Various approaches have been proposed to automate this task. The approaches available, however,...
Sami Beydeda, Volker Gruhn