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» Challenges in Embedded Memory Design and Test
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ISVLSI
2008
IEEE
136views VLSI» more  ISVLSI 2008»
15 years 9 months ago
A Real Case of Significant Scan Test Cost Reduction
With the advent of nanometer technologies, the design size of integrated circuits is getting larger and the operation speed is getting faster. As a consequence, test cost is becom...
Selina Sha, Bruce Swanson
CASES
2003
ACM
15 years 8 months ago
Polynomial-time algorithm for on-chip scratchpad memory partitioning
Focusing on embedded applications, scratchpad memories (SPMs) look like a best-compromise solution when taking into account performance, energy consumption and die area. The main ...
Federico Angiolini, Luca Benini, Alberto Caprara
CODES
2005
IEEE
15 years 9 months ago
Memory access optimizations in instruction-set simulators
Design of programmable processors and embedded applications requires instruction-set simulators for early exploration and validation of candidate architectures. Interpretive simul...
Mehrdad Reshadi, Prabhat Mishra
127
Voted
WSNA
2003
ACM
15 years 8 months ago
Analyzing and modeling encryption overhead for sensor network nodes
Recent research in sensor networks has raised security issues for small embedded devices. Security concerns are motivated by the deployment of a large number of sensory devices in...
Prasanth Ganesan, Ramnath Venugopalan, Pushkin Ped...
178
Voted
IESS
2009
Springer
182views Hardware» more  IESS 2009»
15 years 1 months ago
Modeling Cache Effects at the Transaction Level
Abstract. Embedded system design complexities are growing exponentially. Demand has increased for modeling techniques that can provide both accurate measurements of delay and fast ...
Ardavan Pedram, David Craven, Andreas Gerstlauer