170 search results - page 17 / 34 » Challenges in Embedded Memory Design and Test |
127
Voted
DAC
2003
ACM
16 years 4 months ago
2003
ACM
Software-based self-test (SBST) is an emerging approach to address the challenges of high-quality, at-speed test for complex programmable processors and systems-on chips (SoCs) th...
127
Voted
HOST
2009
IEEE
15 years 1 months ago
2009
IEEE
Abstract-- We report our experiences in designing and implementing several hardware Trojans within the framework of the Embedded System Challenge competition that was held as part ...
119
Voted
DAC
2009
ACM
15 years 10 months ago
2009
ACM
For a computing system to be trusted, it is equally important to verify that the system performs no more and no less functionalities than desired. Traditional testing and verifica...
119
Voted
ASPLOS
2011
ACM
14 years 7 months ago
2011
ACM
New storage-class memory (SCM) technologies, such as phasechange memory, STT-RAM, and memristors, promise user-level access to non-volatile storage through regular memory instruct...
131
Voted
IPSN
2007
Springer
15 years 9 months ago
2007
Springer
Many sensor nodes contain resource constrained microcontrollers where user level applications, operating system components, and device drivers share a single address space with no...