170 search results - page 6 / 34 » Challenges in Embedded Memory Design and Test |
DAC
2009
ACM
15 years 10 months ago
2009
ACM
In this paper, we compare embedded-DRAM (eDRAM) testing to both SRAM testing and commodity-DRAM testing, since an eDRAM macro uses DRAM cells with an SRAM interface. We first star...
TVLSI
2002
14 years 9 months ago
2002
We propose a technique for reducing the energy spent in the memory-processor interface of an embedded system during the execution of firmware code. The method is based on the idea ...
LCTRTS
2009
Springer
15 years 4 months ago
2009
Springer
Dynamic binary translation (DBT) can provide security, virtualization, resource management and other desirable services to embedded systems. Although DBT has many benefits, its r...
VTS
2007
IEEE
15 years 3 months ago
2007
IEEE
In SoC designs, limited test access to internal cores, lowcost external tester’s lack of accuracy and slow frequencies make application of at-speed tests impractical. Therefore,...
78
Voted
DATE
2007
IEEE
15 years 3 months ago
2007
IEEE
Embedded First-In First-Out (FIFO) memories are increasingly used in many IC designs. We have created a new full-custom embedded FIFO module with asynchronous read and write clock...