8370 search results - page 1547 / 1674 » Challenges in P2P Computing |
140
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DAC
2007
ACM
16 years 5 months ago
2007
ACM
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
143
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DAC
2002
ACM
16 years 5 months ago
2002
ACM
At-speed testing of high-speed circuits is becoming increasingly difficult with external testers due to the growing gap between design and tester performance, growing cost of high...
145
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DAC
2004
ACM
16 years 5 months ago
2004
ACM
Efficient energy and performance estimation of embedded software is a critical part of any system-level design flow. Macromodeling based estimation is an attempt to speed up estim...
146
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DAC
2004
ACM
16 years 5 months ago
2004
ACM
Long design cycles due to the inability to predict silicon realities is a well-known problem that plagues analog/RF integrated circuit product development. As this problem worsens...
134
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DAC
2005
ACM
16 years 5 months ago
2005
ACM
As technology advances into the nanometer territory, the interconnect delay has become a first-order effect on chip performance. To handle this effect, the X-architecture has been...