This paper argues for an implicitly parallel programming model for many-core microprocessors, and provides initial technical approaches towards this goal. In an implicitly paralle...
Wen-mei W. Hwu, Shane Ryoo, Sain-Zee Ueng, John H....
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
Kunhyuk Kang, Kee-Jong Kim, Ahmad E. Islam, Muhamm...
At-speed testing of high-speed circuits is becoming increasingly difficult with external testers due to the growing gap between design and tester performance, growing cost of high...
Efficient energy and performance estimation of embedded software is a critical part of any system-level design flow. Macromodeling based estimation is an attempt to speed up estim...
Long design cycles due to the inability to predict silicon realities is a well-known problem that plagues analog/RF integrated circuit product development. As this problem worsens...