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» Characteristic Patterns for LTL
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AMT
2006
Springer
107views Multimedia» more  AMT 2006»
15 years 8 months ago
An Intelligent Process Monitoring System in Complex Manufacturing Environment
In high-tech industries, most manufacturing processes are complexly intertwined, in that manufacturers or engineers can hardly control a whole set of processes. They are only capa...
Sung Ho Ha, Boo-Sik Kang
ECMDAFA
2006
Springer
136views Hardware» more  ECMDAFA 2006»
15 years 8 months ago
Finding a Path to Model Consistency
A core problem in Model Driven Engineering is model consistency achievement: all models must satisfy relationships constraining them. Active consistency techniques monitor and cont...
Gregory de Fombelle, Xavier Blanc, Laurent Rioux, ...
SIGGRAPH
1991
ACM
15 years 8 months ago
Spectrally optimal sampling for distribution ray tracing
Nonuniform sampling of images is a useful technique in computer graphics, because a properly designed pattern of samples can make aliasing take the form of high-frequency random n...
Don P. Mitchell
GPC
2009
Springer
15 years 7 months ago
Balanced Scheduling Algorithm Considering Availability in Mobile Grid
The emerging Grid is extending the scope of resources to mobile devices and sensors that are connected through unreliable networks. Nowadays the number of mobile device users is in...
JongHyuk Lee, SungJin Song, JoonMin Gil, KwangSik ...
ASPDAC
2008
ACM
126views Hardware» more  ASPDAC 2008»
15 years 6 months ago
A Multi-Processor NoC platform applied on the 802.11i TKIP cryptosystem
Since 2001, there have been a myriad of papers on systematic analysis of Multi-Processor System on Chip (MPSoC) and Network on Chip (NoC). Nevertheless, we only have a few of their...
Jung-Ho Lee, Sung-Rok Yoon, Kwang-Eui Pyun, Sin-Ch...