38 search results - page 6 / 8 » Characterizing non-deterministic circuit size |
ISBI
2008
IEEE
15 years 10 months ago
2008
IEEE
We propose a novel method for axonal bouton modeling and automated detection in populations of labeled neurons, as well as bouton distribution analysis for the study of neural cir...
89
Voted
ASPDAC
1998
ACM
15 years 1 months ago
1998
ACM
— Test Pattern Generation for combinational circuits entails the identification of primary input assignments for detecting each fault in a set of target faults. An extension to ...
68
Voted
DAC
2003
ACM
15 years 2 months ago
2003
ACM
This paper presents a compact Nonlinear model Order Reduction Method (NORM) that is applicable for time-invariant and time-varying weakly nonlinear systems. NORM is suitable for r...
SBCCI
2005
ACM
15 years 3 months ago
2005
ACM
A new low-voltage electrically tunable transconductor is presented. Its transconductance can be settled by means of a ratio between a reference current and a reference voltage ren...
70
Voted
ISQED
2010
IEEE
15 years 4 months ago
2010
IEEE
With the CMOS transistors being scaled to sub 45nm and lower, Negative Bias Temperature Instability (NBTI) has become a major concern due to its impact on PMOS transistor aging pr...