Abstract— Over the last decade, the design of ultra-lowpower digital circuits in subthreshold regime has been driven by the quest for minimum energy per operation. In this contri...
David Bol, Renaud Ambroise, Denis Flandre, Jean-Di...
Methods for Worst-Case Execution Time (WCET) analysis have been known for some time, and recently commercial tools have emerged. However, the technique has so far not been much use...
Daniel Sandell, Andreas Ermedahl, Jan Gustafsson, ...
Level-sensitive transparent latches are widely used in high-performance sequential circuit designs. Under process variations, the timing of a transparently latched circuit will ada...
Variations in the semiconductor fabrication process results in variability in parameters between transistors on the same die, a problem exacerbated by lithographic scaling. The re...
In this paper, we present an approved linear-time algorithm for statistical leakage analysis in the present of any spatial correlation condition (strong or weak). The new algorith...