2006 search results - page 33 / 402 » Classification and feature selection with human performance ... |
EVOW
2008
Springer
14 years 11 months ago
2008
Springer
Automatic Defect Classification (ADC) is a well-developed technology for inspection and measurement of defects on patterned wafers in the semiconductors industry. The poor training...
CVPR
2007
IEEE
15 years 1 months ago
2007
IEEE
In this paper, we present a method of object classification within the context of Visual Surveillance. Our goal is the classification of tracked objects into one of the two classe...
ICPR
2004
IEEE
15 years 11 months ago
2004
IEEE
The problem of automatic recognition of human activities is among the most important and challenging open areas of research in Computer Vision. This paper presents a new approach ...
ICISP
2010
Springer
14 years 11 months ago
2010
Springer
Abstract. Gabor wavelet-based methods have been widely used to extract representative features for face analysis. However, the existing methods usually suffer from high computation...
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BMCBI
2010
14 years 10 months ago
2010
Background: Feature selection techniques are critical to the analysis of high dimensional datasets. This is especially true in gene selection from microarray data which are common...