1766 search results - page 285 / 354 » Classifier Selection Based on Data Complexity Measures |
EVOW
2008
Springer
14 years 11 months ago
2008
Springer
Automatic Defect Classification (ADC) is a well-developed technology for inspection and measurement of defects on patterned wafers in the semiconductors industry. The poor training...
GECCO
2003
Springer
15 years 3 months ago
2003
Springer
Abstract. Feature extraction based on evolutionary search offers new possibilities for improving classification accuracy and reducing measurement complexity in many data mining and...
ADBIS
1998
Springer
15 years 2 months ago
1998
Springer
In order to answer efficiently range queries in 2-d R-trees, first we sort queries by means of a space filling curve, then we group them together, and finally pass them for process...
SIP
2001
14 years 11 months ago
2001
In this paper we present a new method to estimate optical flow for large displacements. It is based on prediction of global flow field parameters, performs better than multiresolu...
PERCOM
2010
ACM
14 years 8 months ago
2010
ACM
Abstract—Becoming proficient in a sport requires significant investment in training. Wearable sensor devices can improve training due to the high level of mobility, ubiquity and...