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ISQED
2002
IEEE
137views Hardware» more  ISQED 2002»
15 years 2 months ago
A Comprehensive Layout Methodology and Layout-Specific Circuit Analyses for Three-Dimensional Integrated Circuits
In this paper, we describe a comprehensive layout methodology for bonded three-dimensional integrated circuits (3D ICs). In bonded 3D integration technology, parts of a circuit ar...
Syed M. Alam, Donald E. Troxel, Carl V. Thompson
ASPDAC
2007
ACM
144views Hardware» more  ASPDAC 2007»
15 years 1 months ago
Parameter Reduction for Variability Analysis by Slice Inverse Regression (SIR) Method
With semiconductor fabrication technologies scaled below 100 nm, the design-manufacturing interface becomes more and more complicated. The resultant process variability causes a nu...
Alexander V. Mitev, Michael Marefat, Dongsheng Ma,...
DAC
1997
ACM
15 years 1 months ago
Electronic Component Information Exchange (ECIX)
A number of industry trends are shaping the requirements for IC and electronic equipment design. The density and complexity of circuit technologies have increased to a point where...
Donald R. Cottrell
ICS
2009
Tsinghua U.
15 years 2 months ago
A comprehensive power-performance model for NoCs with multi-flit channel buffers
Large Multi-Processor Systems-on-Chip use Networks-on-Chip with a high degree of reusability and scalability for message communication. Therefore, network infrastructure is a cruc...
Mohammad Arjomand, Hamid Sarbazi-Azad
CORR
2008
Springer
148views Education» more  CORR 2008»
14 years 9 months ago
Copper Electrodeposition for 3D Integration
Abstract-Two dimensional (2D) integration has been the traditional approach for IC integration. Increasing demands for providing electronic devices with superior performance and fu...
Rozalia Beica, Charles Sharbono, Tom Ritzdorf