18 search results - page 4 / 4 » Coefficient-based parametric faults detection in analog circ... |
ETS
2009
IEEE
14 years 7 months ago
2009
IEEE
This paper reports two novel algorithms based on time-modulo reconstruction method intended for detection of the parametric faults in analogue-to-digital converters (ADC). In both ...
EH
2003
IEEE
15 years 2 months ago
2003
IEEE
This paper presents experimental results of fast intrinsic evolutionary design and evolutionary fault recovery of a 4-bit Digital to Analog Converter (DAC) using the JPL stand-alo...
VTS
2000
IEEE
15 years 1 months ago
2000
IEEE
The performance of deep sub-micron designs can be affected by various parametric variations, manufacturing defects, noise or even modeling errors that are all statistical in natur...