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TVLSI
2008
107views more  TVLSI 2008»
14 years 9 months ago
Novel Probabilistic Combinational Equivalence Checking
Exact approaches to combinational equivalence checking, such as automatic test pattern generation-based, binary decision diagrams (BDD)-based, satisfiability-based, and hybrid appr...
Shih-Chieh Wu, Chun-Yao Wang, Yung-Chih Chen
DAC
1997
ACM
15 years 1 months ago
Equivalence Checking Using Cuts and Heaps
This paper presents a verification technique which is specifically targeted to formally comparing large combinational circuits with some structural similarities. The approach co...
Andreas Kuehlmann, Florian Krohm
DFT
2003
IEEE
117views VLSI» more  DFT 2003»
15 years 2 months ago
Fault Tolerant Design of Combinational and Sequential Logic Based on a Parity Check Code
We describe a method for designing fault tolerant circuits based on an extension of a Concurrent Error Detection (CED) technique. The proposed extension combines parity check code...
Sobeeh Almukhaizim, Yiorgos Makris
ICCAD
2006
IEEE
128views Hardware» more  ICCAD 2006»
15 years 6 months ago
Improvements to combinational equivalence checking
The paper explores several ways to improve the speed and capacity of combinational equivalence checking based on Boolean satisfiability (SAT). State-of-the-art methods use simulat...
Alan Mishchenko, Satrajit Chatterjee, Robert K. Br...
ICCD
2004
IEEE
134views Hardware» more  ICCD 2004»
15 years 6 months ago
An Automatic Test Pattern Generation Framework for Combinational Threshold Logic Networks
— We propose an automatic test pattern generation (ATPG) framework for combinational threshold networks. The motivation behind this work lies in the fact that many emerging nanot...
Pallav Gupta, Rui Zhang, Niraj K. Jha