10891 search results - page 142 / 2179 » Combining Model Reductions |
ETS
2007
IEEE
15 years 9 months ago
2007
IEEE
This paper summarizes advanced test patterns designed to target dynamic and time-related faults caused by new defect mechanisms in deep-submicron memory technologies. Such tests a...
113
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SPIN
2005
Springer
15 years 8 months ago
2005
Springer
We describe an improvement of the partial-order reduction algorithm for breadth-first search which was introduced in Spin version 4.0. Our improvement is based on the algorithm by...
143
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AAAI
2008
15 years 5 months ago
2008
Recent study has shown that canonical algorithms such as Principal Component Analysis (PCA) and Linear Discriminant Analysis (LDA) can be obtained from graph based dimensionality ...
116
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MTV
2007
IEEE
15 years 9 months ago
2007
IEEE
Test vector ordering is recognized as a simple and non-intrusive approach to assist test power reduction. Simulation based test vector ordering approach to minimize circuit transit...
125
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VTC
2006
IEEE
15 years 9 months ago
2006
IEEE
— Adaptive antennas are currently being integrated into wireless systems. As one of the first standards the wireless metropolitan area network IEEE 802.16 provides means to suppo...